Sunandini Sanyal, Sravanti Addepalli, R. Venkatesh Babu. Towards Data-Free Model Stealing in a Hard Label Setting. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 15263-15272, IEEE, 2022. [doi]
Abstract is missing.