Shanker Sanyal, Ken Aida, Kostas Gaitanos, George Wowk, Sam Lahiri. Defect tracking and reliability modeling for a new product release. In John E. Botsford, Arthur G. Ryman, Jacob Slonim, David J. Taylor, editors, Proceedings of the 1992 Conference of the Centre for Advanced Studies on Collaborative Research, November 9-12, 1992, Toronto, Ontario, Canada, 2 Volumes. pages 409-422, IBM, 1992. [doi]
Abstract is missing.