Alodeep Sanyal, Yervant Zorian. Special session 12C: Town-hall meeting "young professionals in test". In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1, IEEE Computer Society, 2013. [doi]
@inproceedings{SanyalZ13,
title = {Special session 12C: Town-hall meeting "young professionals in test"},
author = {Alodeep Sanyal and Yervant Zorian},
year = {2013},
doi = {10.1109/VTS.2013.6548946},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2013.6548946},
researchr = {https://researchr.org/publication/SanyalZ13},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-5542-1},
}