Black-box identity testing of depth-4 multilinear circuits - researchr publication authors

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Shubhangi Saraf, Ilya Volkovich. Black-box identity testing of depth-4 multilinear circuits. In Lance Fortnow, Salil P. Vadhan, editors, Proceedings of the 43rd ACM Symposium on Theory of Computing, STOC 2011, San Jose, CA, USA, 6-8 June 2011. pages 421-430, ACM, 2011. [doi]

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