Shubhangi Saraf, Ilya Volkovich. Black-box identity testing of depth-4 multilinear circuits. In Lance Fortnow, Salil P. Vadhan, editors, Proceedings of the 43rd ACM Symposium on Theory of Computing, STOC 2011, San Jose, CA, USA, 6-8 June 2011. pages 421-430, ACM, 2011. [doi]
@inproceedings{SarafV11,
title = {Black-box identity testing of depth-4 multilinear circuits},
author = {Shubhangi Saraf and Ilya Volkovich},
year = {2011},
doi = {10.1145/1993636.1993693},
url = {http://doi.acm.org/10.1145/1993636.1993693},
tags = {testing},
researchr = {https://researchr.org/publication/SarafV11},
cites = {0},
citedby = {0},
pages = {421-430},
booktitle = {Proceedings of the 43rd ACM Symposium on Theory of Computing, STOC 2011, San Jose, CA, USA, 6-8 June 2011},
editor = {Lance Fortnow and Salil P. Vadhan},
publisher = {ACM},
isbn = {978-1-4503-0691-1},
}