Pablo Saraza-Canflanca, Javier Martín-Martínez, Elisenda Roca, Rafael Castro-López, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández 0001. A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation. In 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2022, Villasimius, Italy, June 12-15, 2022. pages 1-4, IEEE, 2022. [doi]
Abstract is missing.