Sudha Sarma. Built-In Self-Test Considerations in a High-Performance, General-Purpose Processor. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 21-27, IEEE Computer Society, 1991.
@inproceedings{Sarma91:0,
title = {Built-In Self-Test Considerations in a High-Performance, General-Purpose Processor},
author = {Sudha Sarma},
year = {1991},
tags = {testing},
researchr = {https://researchr.org/publication/Sarma91%3A0},
cites = {0},
citedby = {0},
pages = {21-27},
booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
publisher = {IEEE Computer Society},
isbn = {0-8186-9156-5},
}