Peter Sarson, Haruo Kobayashi. Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs. J. Electronic Testing, 33(3):295-303, 2017. [doi]
@article{SarsonK17,
title = {Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs},
author = {Peter Sarson and Haruo Kobayashi},
year = {2017},
doi = {10.1007/s10836-016-5630-0},
url = {https://doi.org/10.1007/s10836-016-5630-0},
researchr = {https://researchr.org/publication/SarsonK17},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {33},
number = {3},
pages = {295-303},
}