Peter Sarson, Tomonori Yanagida, Kosuke Machida. Group delay measurement of frequency down-converter devices using chirped RF modulated signal. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
@inproceedings{SarsonYM18-0,
title = {Group delay measurement of frequency down-converter devices using chirped RF modulated signal},
author = {Peter Sarson and Tomonori Yanagida and Kosuke Machida},
year = {2018},
doi = {10.1109/VTS.2018.8368620},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2018.8368620},
researchr = {https://researchr.org/publication/SarsonYM18-0},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-3774-6},
}