Characteristics of SiN/GaAs interface under exposure to high-temperature and high-humidity conditions measured by photoreflectance spectroscopy - researchr publication authors

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Hajime Sasaki, Takayuki Hisaka, Kaoru Kadoiwa, Yoshikazu Terai, Yasufumi Fujiwara. Characteristics of SiN/GaAs interface under exposure to high-temperature and high-humidity conditions measured by photoreflectance spectroscopy. IEICE Electronic Express, 9(20):1592-1597, 2012. [doi]

This author has not been identified. Look up 'Hajime Sasaki' in GoogleThis author has not been identified. Look up 'Takayuki Hisaka' in GoogleThis author has not been identified. Look up 'Kaoru Kadoiwa' in GoogleThis author has not been identified. Look up 'Yoshikazu Terai' in GoogleThis author has not been identified. Look up 'Yasufumi Fujiwara' in Google

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