Yuto Sasaki, Kosuke Machida, Riho Aoki, Shogo Katayama, Takayuki Nakatani, Jianlong Wang, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi. Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion. In IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.