Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian. Optimal Multiple Chain Relay Testing Scheme for MCMs on Large Area Substrates. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 818-827, IEEE Computer Society, 1996.
@inproceedings{SasidharCZ96,
title = {Optimal Multiple Chain Relay Testing Scheme for MCMs on Large Area Substrates},
author = {Koppolu Sasidhar and Abhijit Chatterjee and Yervant Zorian},
year = {1996},
tags = {testing},
researchr = {https://researchr.org/publication/SasidharCZ96},
cites = {0},
citedby = {0},
pages = {818-827},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}