Temporal Discharge Current Driven Clustering for Improved Leakage Power Reduction in Row-Based Power-Gating

Ashoka Visweswara Sathanur, Luca Benini, Alberto Macii, Enrico Macii, Massimo Poncino. Temporal Discharge Current Driven Clustering for Improved Leakage Power Reduction in Row-Based Power-Gating. In Lars Svensson, José Monteiro, editors, Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 18th International Workshop, PATMOS 2008, Lisbon, Portugal, September 10-12, 2008. Revised Selected Papers. Volume 5349 of Lecture Notes in Computer Science, pages 42-51, Springer, 2008. [doi]

Abstract

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