Osman Berk Satir, Ipek Baz, Ertunc Erdil, Müjdat Çetin. On comparison of different classification techniques for the fine-grained retail product recognition problem. In 25th Signal Processing and Communications Applications Conference, SIU 2017, Antalya, Turkey, May 15-18, 2017. pages 1-4, IEEE, 2017. [doi]
Abstract is missing.