Nobuhiro Sato, Yoshihiro Hashimoto. A High Precision IDDQ Measurement System With Improved Dynamic Load Regulation. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 410-414, IEEE Computer Society, 2003. [doi]
@inproceedings{SatoH03:3, title = {A High Precision IDDQ Measurement System With Improved Dynamic Load Regulation}, author = {Nobuhiro Sato and Yoshihiro Hashimoto}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630410abs.htm}, researchr = {https://researchr.org/publication/SatoH03%3A3}, cites = {0}, citedby = {0}, pages = {410-414}, booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA}, publisher = {IEEE Computer Society}, isbn = {0-7803-8106-8}, }