Nobuhiro Sato, Yoshihiro Hashimoto. A High Precision IDDQ Measurement System With Improved Dynamic Load Regulation. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 410-414, IEEE Computer Society, 2003. [doi]
Abstract is missing.