Yasuo Sato, Toyohito Ikeya, Machinobu Nakao, Takaharu Nagumo. A BIST approach for very deep sub-micron (VDSM) defects. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 283-291, IEEE Computer Society, 2000.
@inproceedings{SatoINN00,
title = {A BIST approach for very deep sub-micron (VDSM) defects},
author = {Yasuo Sato and Toyohito Ikeya and Machinobu Nakao and Takaharu Nagumo},
year = {2000},
tags = {systematic-approach},
researchr = {https://researchr.org/publication/SatoINN00},
cites = {0},
citedby = {0},
pages = {283-291},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}