Accurate prediction of the impact of on-chip inductance on interconnect delay using electrical and physical parameter-based RSF

Takashi Sato, Toshiki Kanamoto, Atsushi Kurokawa, Yoshiyuki Kawakami, Hiroki Oka, Tomoyasu Kitaura, Hiroyuki Kobayashi, Masanori Hashimoto. Accurate prediction of the impact of on-chip inductance on interconnect delay using electrical and physical parameter-based RSF. In Hiroto Yasuura, editor, Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003. pages 149-155, ACM, 2003. [doi]

@inproceedings{SatoKKKOKKH03,
  title = {Accurate prediction of the impact of on-chip inductance on interconnect delay using electrical and physical parameter-based RSF},
  author = {Takashi Sato and Toshiki Kanamoto and Atsushi Kurokawa and Yoshiyuki Kawakami and Hiroki Oka and Tomoyasu Kitaura and Hiroyuki Kobayashi and Masanori Hashimoto},
  year = {2003},
  doi = {10.1145/1119772.1119802},
  url = {http://doi.acm.org/10.1145/1119772.1119802},
  researchr = {https://researchr.org/publication/SatoKKKOKKH03},
  cites = {0},
  citedby = {0},
  pages = {149-155},
  booktitle = {Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003},
  editor = {Hiroto Yasuura},
  publisher = {ACM},
  isbn = {0-7803-7660-9},
}