Takashi Sato, Toshiki Kanamoto, Atsushi Kurokawa, Yoshiyuki Kawakami, Hiroki Oka, Tomoyasu Kitaura, Hiroyuki Kobayashi, Masanori Hashimoto. Accurate prediction of the impact of on-chip inductance on interconnect delay using electrical and physical parameter-based RSF. In Hiroto Yasuura, editor, Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003. pages 149-155, ACM, 2003. [doi]
@inproceedings{SatoKKKOKKH03, title = {Accurate prediction of the impact of on-chip inductance on interconnect delay using electrical and physical parameter-based RSF}, author = {Takashi Sato and Toshiki Kanamoto and Atsushi Kurokawa and Yoshiyuki Kawakami and Hiroki Oka and Tomoyasu Kitaura and Hiroyuki Kobayashi and Masanori Hashimoto}, year = {2003}, doi = {10.1145/1119772.1119802}, url = {http://doi.acm.org/10.1145/1119772.1119802}, researchr = {https://researchr.org/publication/SatoKKKOKKH03}, cites = {0}, citedby = {0}, pages = {149-155}, booktitle = {Proceedings of the 2003 Asia and South Pacific Design Automation Conference, ASP-DAC '03, Kitakyushu, Japan, January 21-24, 2003}, editor = {Hiroto Yasuura}, publisher = {ACM}, isbn = {0-7803-7660-9}, }