Shin-ichi Sato, Akito Monden, Ken-ichi Matsumoto. Evaluating the applicability of reliability prediction models between different software. In Mikio Aoyama, Katsuro Inoue, Václav Rajlich, editors, Proceedings of the International Workshop on Principles of Software Evolution, IWPSE '02, Orlando, Florida, USA, May 19-20, 2002. pages 97-102, ACM, 2002. [doi]
Abstract is missing.