Yasuo Sato, Masafumi Monden, Yousuke Miyake, Seiji Kajihara. Reduction of NBTI-Induced Degradation on Ring Oscillators in FPGA. In 20th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2014, Singapore, November 18-21, 2014. pages 59-67, IEEE, 2014. [doi]
Abstract is missing.