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Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development

Masayuki Sato, Hiroki Wakamatsu, Masayuki Arai, Kenichi Ichino, Kazuhiko Iwasaki, Takeshi Asakawa. Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development. JIPS, 4(4):121-132, 2008. [doi]

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