Saswata Satpathi, Sourav Bagchi, Aurobinda Routray, Partha Sarathi Satpathi, Ritwik Dash. Adaptive Change Detection of the temperature pattern of the face for identifying deceit. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{SatpathiBRSD21,
title = {Adaptive Change Detection of the temperature pattern of the face for identifying deceit},
author = {Saswata Satpathi and Sourav Bagchi and Aurobinda Routray and Partha Sarathi Satpathi and Ritwik Dash},
year = {2021},
doi = {10.1109/IECON48115.2021.9589946},
url = {https://doi.org/10.1109/IECON48115.2021.9589946},
researchr = {https://researchr.org/publication/SatpathiBRSD21},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3554-3},
}