Sudhir Satpathy, Sanu Mathew, Vikram Suresh, Vinodh Gopal, James Guilford, Mark Anders, Himanshu Kaul, Amit Agarwal, Steven Hsu, Ram Krishnamurthy. A 280mV 3.1pJ/code Huffman Decoder for DEFLATE Decompression Featuring Opportunistic Code Skip and 3-way Symbol Generation in 14nm Tri-gate CMOS. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018. pages 263-266, IEEE, 2018. [doi]
@inproceedings{SatpathyMSGGAKA18-0,
title = {A 280mV 3.1pJ/code Huffman Decoder for DEFLATE Decompression Featuring Opportunistic Code Skip and 3-way Symbol Generation in 14nm Tri-gate CMOS},
author = {Sudhir Satpathy and Sanu Mathew and Vikram Suresh and Vinodh Gopal and James Guilford and Mark Anders and Himanshu Kaul and Amit Agarwal and Steven Hsu and Ram Krishnamurthy},
year = {2018},
doi = {10.1109/ASSCC.2018.8579341},
url = {https://doi.org/10.1109/ASSCC.2018.8579341},
researchr = {https://researchr.org/publication/SatpathyMSGGAKA18-0},
cites = {0},
citedby = {0},
pages = {263-266},
booktitle = {IEEE Asian Solid-State Circuits Conference, A-SSCC 2018, Tainan, Taiwan, November 5-7, 2018},
publisher = {IEEE},
isbn = {978-1-5386-6413-1},
}