Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra, Bernd Becker. Early-life-failure detection using SAT-based ATPG. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-10, IEEE Computer Society, 2013. [doi]
@inproceedings{SauerKSKDCKMB13,
title = {Early-life-failure detection using SAT-based ATPG},
author = {Matthias Sauer and Young Moon Kim and Jun Seomun and Hyung-Ock Kim and Kyung Tae Do and Jung Yun Choi and Kee Sup Kim and Subhasish Mitra and Bernd Becker},
year = {2013},
doi = {10.1109/TEST.2013.6651925},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2013.6651925},
researchr = {https://researchr.org/publication/SauerKSKDCKMB13},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013},
publisher = {IEEE Computer Society},
}