XSTRESSOR : Automatic Generation of Large-Scale Worst-Case Test Inputs by Inferring Path Conditions - researchr publication bibliographies

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Charitha Saumya, Jinkyu Koo, Milind Kulkarni 0001, Saurabh Bagchi. XSTRESSOR : Automatic Generation of Large-Scale Worst-Case Test Inputs by Inferring Path Conditions. In 12th IEEE Conference on Software Testing, Validation and Verification, ICST 2019, Xi'an, China, April 22-27, 2019. pages 1-12, IEEE, 2019. [doi]

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