Charitha Saumya, Jinkyu Koo, Milind Kulkarni 0001, Saurabh Bagchi. XSTRESSOR : Automatic Generation of Large-Scale Worst-Case Test Inputs by Inferring Path Conditions. In 12th IEEE Conference on Software Testing, Validation and Verification, ICST 2019, Xi'an, China, April 22-27, 2019. pages 1-12, IEEE, 2019. [doi]
@inproceedings{SaumyaK0B19,
title = {XSTRESSOR : Automatic Generation of Large-Scale Worst-Case Test Inputs by Inferring Path Conditions},
author = {Charitha Saumya and Jinkyu Koo and Milind Kulkarni 0001 and Saurabh Bagchi},
year = {2019},
doi = {10.1109/ICST.2019.00011},
url = {https://doi.org/10.1109/ICST.2019.00011},
researchr = {https://researchr.org/publication/SaumyaK0B19},
cites = {0},
citedby = {0},
pages = {1-12},
booktitle = {12th IEEE Conference on Software Testing, Validation and Verification, ICST 2019, Xi'an, China, April 22-27, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1736-2},
}