On the accurate determination of the thermomechanical properties of micro-scale material: Application to AlSi::1 :: chip metallization of a power semiconductor device

J. B. Sauveplane, E. Scheid, A. Deram. On the accurate determination of the thermomechanical properties of micro-scale material: Application to AlSi::1 :: chip metallization of a power semiconductor device. Microelectronics Reliability, 49(5):499-505, 2009. [doi]

Abstract

Abstract is missing.