3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET

J. B. Sauveplane, P. Tounsi, E. Scheid, A. Deram. 3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET. Microelectronics Reliability, 48(8-9):1464-1467, 2008. [doi]

Authors

J. B. Sauveplane

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P. Tounsi

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E. Scheid

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A. Deram

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