3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET

J. B. Sauveplane, P. Tounsi, E. Scheid, A. Deram. 3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET. Microelectronics Reliability, 48(8-9):1464-1467, 2008. [doi]

Abstract

Abstract is missing.