A Pragmatic Approach to the Design of Self-Testing Circuits

Yvon Savaria, Bruno Laguë, Bozena Kaminska. A Pragmatic Approach to the Design of Self-Testing Circuits. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 745-754, IEEE Computer Society, 1989.

Authors

Yvon Savaria

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Bruno Laguë

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Bozena Kaminska

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