Vladimir V. Savchenko, Stanislav Sedukhin. Pattern Dependent Reconstruction of Raster Digital Elevation Models from Contour Maps. In M. H. Hamza, editor, Proceedings of the IASTED International Conference on Visualization, Imaging and Image Processing (VIIP 2001), Marbella, Spain, September 3-5, 2001. pages 237-244, ACTA Press, 2001.
Abstract is missing.