Jacob Savir. On-line and off-line test of airborne digital systems: a reliability study. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 35-44, IEEE Computer Society, 2000.
@inproceedings{Savir00,
title = {On-line and off-line test of airborne digital systems: a reliability study},
author = {Jacob Savir},
year = {2000},
tags = {testing, reliability},
researchr = {https://researchr.org/publication/Savir00},
cites = {0},
citedby = {0},
pages = {35-44},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}