Manolis Savva, Nicholas Kong, Arti Chhajta, Fei-Fei Li, Maneesh Agrawala, Jeffrey Heer. ReVision: automated classification, analysis and redesign of chart images. In Jeffrey S. Pierce, Maneesh Agrawala, Scott R. Klemmer, editors, Proceedings of the 24th Annual ACM Symposium on User Interface Software and Technology, Santa Barbara, CA, USA, October 16-19, 2011. pages 393-402, ACM, 2011. [doi]
Abstract is missing.