Diagonal Circuit Identity Testing and Lower Bounds

Nitin Saxena. Diagonal Circuit Identity Testing and Lower Bounds. In Manindra Agrawal, Harry Buhrman, Lance Fortnow, Thomas Thierauf, editors, Algebraic Methods in Computational Complexity, 07.10. - 12.10.2007. Volume 07411 of Dagstuhl Seminar Proceedings, Internationales Begegnungs- und Forschungszentrum fuer Informatik (IBFI), Schloss Dagstuhl, Germany, 2007. [doi]

Abstract

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