Simple Bounds on Serial Signature Analysis Aliasing for Random Testing

Nirmal R. Saxena, Piero Franco, Edward J. McCluskey. Simple Bounds on Serial Signature Analysis Aliasing for Random Testing. IEEE Transactions on Computers, 41(5):638-645, 1992.

@article{SaxenaFM92,
  title = {Simple Bounds on Serial Signature Analysis Aliasing for Random Testing},
  author = {Nirmal R. Saxena and Piero Franco and Edward J. McCluskey},
  year = {1992},
  tags = {testing, analysis, random testing},
  researchr = {https://researchr.org/publication/SaxenaFM92},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Computers},
  volume = {41},
  number = {5},
  pages = {638-645},
}