Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang. Binary Nonnegative Matrix Factorization Applied to Semi-conductor Wafer Test Sets. In Tülay Adali, Christian Jutten, João Marcos Travassos Romano, Allan Kardec Barros, editors, Independent Component Analysis and Signal Separation, 8th International Conference, ICA 2009, Paraty, Brazil, March 15-18, 2009. Proceedings. Volume 5441 of Lecture Notes in Computer Science, pages 710-717, Springer, 2009. [doi]
Abstract is missing.