Multi-dimensional local binary pattern descriptors for improved texture analysis

Gerald Schaefer, Niraj P. Doshi. Multi-dimensional local binary pattern descriptors for improved texture analysis. In Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012. pages 2500-2503, IEEE, 2012. [doi]

Abstract

Abstract is missing.