Art Schaldenbrand, Jushan Xie, Hany Elhak. Recent Updates to Transistor Level Reliability Analysis. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-8, IEEE, 2019. [doi]
@inproceedings{SchaldenbrandXE19,
title = {Recent Updates to Transistor Level Reliability Analysis},
author = {Art Schaldenbrand and Jushan Xie and Hany Elhak},
year = {2019},
doi = {10.1109/IRPS.2019.8720540},
url = {https://doi.org/10.1109/IRPS.2019.8720540},
researchr = {https://researchr.org/publication/SchaldenbrandXE19},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}