Omar Schiaratura, Pietro Ansaloni, Giovanni Lughi, Mattia Neri, Matteo Roffilli, Fabrizio Serpi, Andrea Simonetto. SoC-Based Pattern Recognition Systems for Non Destructive Testing. In Panos M. Pardalos, Mario Pavone, Giovanni Maria Farinella, Vincenzo Cutello, editors, Machine Learning, Optimization, and Big Data - First International Workshop, MOD 2015, Taormina, Sicily, Italy, July 21-23, 2015, Revised Selected Papers. Volume 9432 of Lecture Notes in Computer Science, pages 209-221, Springer, 2015. [doi]
@inproceedings{SchiaraturaALNR15,
title = {SoC-Based Pattern Recognition Systems for Non Destructive Testing},
author = {Omar Schiaratura and Pietro Ansaloni and Giovanni Lughi and Mattia Neri and Matteo Roffilli and Fabrizio Serpi and Andrea Simonetto},
year = {2015},
doi = {10.1007/978-3-319-27926-8_18},
url = {http://dx.doi.org/10.1007/978-3-319-27926-8_18},
researchr = {https://researchr.org/publication/SchiaraturaALNR15},
cites = {0},
citedby = {0},
pages = {209-221},
booktitle = {Machine Learning, Optimization, and Big Data - First International Workshop, MOD 2015, Taormina, Sicily, Italy, July 21-23, 2015, Revised Selected Papers},
editor = {Panos M. Pardalos and Mario Pavone and Giovanni Maria Farinella and Vincenzo Cutello},
volume = {9432},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-319-27925-1},
}