Combining Unit Tests for Data Race Detection

Jochen Schimmel, Korbinian Molitorisz, Ali Jannesari, Walter F. Tichy. Combining Unit Tests for Data Race Detection. In Hong Zhu, Dan Hao, Leonardo Mariani, Rajesh Subramanyan, editors, 10th IEEE/ACM International Workshop on Automation of Software Test, AST 2015, Florence, Italy, May 23-24, 2015. pages 43-47, IEEE, 2015. [doi]

Authors

Jochen Schimmel

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Korbinian Molitorisz

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Ali Jannesari

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Walter F. Tichy

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