Jochen Schimmel, Korbinian Molitorisz, Ali Jannesari, Walter F. Tichy. Combining Unit Tests for Data Race Detection. In Hong Zhu, Dan Hao, Leonardo Mariani, Rajesh Subramanyan, editors, 10th IEEE/ACM International Workshop on Automation of Software Test, AST 2015, Florence, Italy, May 23-24, 2015. pages 43-47, IEEE, 2015. [doi]
No references recorded for this publication.
No citations of this publication recorded.