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Dynamic lock-in thermography for operation mode-dependent thermally active fault localization

Rudolf Schlangen, Hervé Deslandes, Ted Lundquist, C. Schmidt, F. Altmann, K. Yu, A. Andreasyan, S. Li. Dynamic lock-in thermography for operation mode-dependent thermally active fault localization. Microelectronics Reliability, 50(9-11):1454-1458, 2010. [doi]

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Rudolf Schlangen

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Hervé Deslandes

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Ted Lundquist

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C. Schmidt

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F. Altmann

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K. Yu

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A. Andreasyan

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S. Li

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