Rudolf Schlangen, Hervé Deslandes, Ted Lundquist, C. Schmidt, F. Altmann, K. Yu, A. Andreasyan, S. Li. Dynamic lock-in thermography for operation mode-dependent thermally active fault localization. Microelectronics Reliability, 50(9-11):1454-1458, 2010. [doi]
@article{SchlangenDLSAYAL10,
title = {Dynamic lock-in thermography for operation mode-dependent thermally active fault localization},
author = {Rudolf Schlangen and Hervé Deslandes and Ted Lundquist and C. Schmidt and F. Altmann and K. Yu and A. Andreasyan and S. Li},
year = {2010},
doi = {10.1016/j.microrel.2010.07.082},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.082},
tags = {C++},
researchr = {https://researchr.org/publication/SchlangenDLSAYAL10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1454-1458},
}