NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification

Christian Schlünder, K. Puschkarsky, Gunnar Andreas Rott, Wolfgang Gustin, Hans Reisinger. NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification. Microelectronics Reliability, 82:1-10, 2018. [doi]

Abstract

Abstract is missing.