Output analysis: on choosing a single criterion for confidence-interval procedures

Bruce W. Schmeiser, Yingchieh Yeh. Output analysis: on choosing a single criterion for confidence-interval procedures. In Jane L. Snowdon, John M. Charnes, editors, Proceedings of the 34th Winter Simulation Conference: Exploring New Frontiers, San Diego, California, USA, December 8-11, 2002. pages 345-352, ACM, 2002. [doi]

Abstract

Abstract is missing.