Andreas Schmidt, Soren Buhler, Robert Senger, Steffen Scholz, Markus Dickerhof. Detection and Visual Inspection of Highly Obfuscated Plagiarisms. In Tung X. Bui, Ralph H. Sprague Jr., editors, 49th Hawaii International Conference on System Sciences, HICSS 2016, Koloa, HI, USA, January 5-8, 2016. pages 4113-4122, IEEE, 2016. [doi]
@inproceedings{SchmidtBSSD16,
title = {Detection and Visual Inspection of Highly Obfuscated Plagiarisms},
author = {Andreas Schmidt and Soren Buhler and Robert Senger and Steffen Scholz and Markus Dickerhof},
year = {2016},
doi = {10.1109/HICSS.2016.510},
url = {http://dx.doi.org/10.1109/HICSS.2016.510},
researchr = {https://researchr.org/publication/SchmidtBSSD16},
cites = {0},
citedby = {0},
pages = {4113-4122},
booktitle = {49th Hawaii International Conference on System Sciences, HICSS 2016, Koloa, HI, USA, January 5-8, 2016},
editor = {Tung X. Bui and Ralph H. Sprague Jr.},
publisher = {IEEE},
isbn = {978-0-7695-5670-3},
}