Andreas Schmidt, Soren Buhler, Robert Senger, Steffen Scholz, Markus Dickerhof. Detection and Visual Inspection of Highly Obfuscated Plagiarisms. In Tung X. Bui, Ralph H. Sprague Jr., editors, 49th Hawaii International Conference on System Sciences, HICSS 2016, Koloa, HI, USA, January 5-8, 2016. pages 4113-4122, IEEE, 2016. [doi]
Abstract is missing.