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MEMS based inclinometers: Noise characteristics and suitable signal processing

Roland Schmidt, Paul O'Leary, Roland Ritt, Matthew Harker. MEMS based inclinometers: Noise characteristics and suitable signal processing. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, May 22-25, 2017. pages 1-6, IEEE, 2017. [doi]

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Roland Schmidt

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Paul O'Leary

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Roland Ritt

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Matthew Harker

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