MEMS based inclinometers: Noise characteristics and suitable signal processing

Roland Schmidt, Paul O'Leary, Roland Ritt, Matthew Harker. MEMS based inclinometers: Noise characteristics and suitable signal processing. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, May 22-25, 2017. pages 1-6, IEEE, 2017. [doi]

@inproceedings{SchmidtORH17,
  title = {MEMS based inclinometers: Noise characteristics and suitable signal processing},
  author = {Roland Schmidt and Paul O'Leary and Roland Ritt and Matthew Harker},
  year = {2017},
  doi = {10.1109/I2MTC.2017.7969830},
  url = {https://doi.org/10.1109/I2MTC.2017.7969830},
  researchr = {https://researchr.org/publication/SchmidtORH17},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, May 22-25, 2017},
  publisher = {IEEE},
  isbn = {978-1-5090-3596-0},
}