Jost Schnee, Norbert Bachfischer, Dirk Berndt, Matthias Hübner, Christian Teutsch. Objective Quality Evaluation of Laser Markings for Assembly Control. In Dominik Slezak, Sankar K. Pal, Byeong Ho Kang, Junzhong Gu, Hideo Kuroda, Tai-Hoon Kim, editors, Signal Processing, Image Processing and Pattern Recognition - International Conference, SIP 2009, Held as Part of the Future Generation Information Technology Conference, FGIT 2009, Jeju Island, Korea, December 10-12, 2009. Proceedings. Volume 61 of Communications in Computer and Information Science, pages 17-24, Springer, 2009. [doi]
Abstract is missing.